Mapping Residual Stress Profiles at the Micron Scale Using FIB Micro-Hole Drilling

B. Winiarski, Philip J. Withers
  • Applied Mechanics and Materials, June 2010, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/amm.24-25.267

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http://dx.doi.org/10.4028/www.scientific.net/amm.24-25.267

The following have contributed to this page: Professor Philip J Withers