A Comparison of Free Carrier Absorption and Capacitance Voltage Methods for Interface Trap Measurements

Sethu Saveda Suvanam, M. Usman, K. Gulbinas, V. Grivickas, Anders Hallén
  • Materials Science Forum, January 2013, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/msf.740-742.465
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The following have contributed to this page: Dr. Muhammad Usman