Dependence of the Surface Roughness and Localization Factor Parameters on the Background Correction of AFM Images: A Thin Film Characterization Study

Attila Bonyár, Lászlo Milán Molnár, Gábor Harsányi
  • Materials Science Forum, November 2012, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/msf.729.193
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The following have contributed to this page: Dr. Attila Bonyár