Effect of Nuclear Scattering Damage at SiO2/SiC and Al2O3/SiC Interfaces – a Radiation Hardness Study of Dielectrics

Muhammad Usman, Anders Hallén, K. Gulbinas, Vytautas Grivickas
  • Materials Science Forum, May 2012, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/msf.717-720.805
The author haven't finished explaining this publicationThe author haven't finished explaining this publication

The following have contributed to this page: Dr. Muhammad Usman