Self-Similarity of Electrochemically-Deposited Copper Films on Porous Silicon

  • Lan Li Chen, Bao Gai Zhai, Yuan Ming Huang
  • Key Engineering Materials, January 2010, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/kem.428-429.515

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http://dx.doi.org/10.4028/www.scientific.net/kem.428-429.515