Determination of the Interface Roughness between Ni-Coated Layer and Cu Substrate by Glow Discharge Optical Emission Spectroscopy Depth Profiling

Yi Liu, Wei Xuan Lin, Wei Bing Ye, Huan Sheng Li, Jiong Li, Wei Hua Yu, Jiang Yong Wang
  • Advanced Materials Research, March 2015, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/amr.1094.181
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