Drain Side N+ Layout Manners ("npnpn" Arranged-Type) on ESD Robustness in the 60-V pLDMOS-SCR

Shen Li Chen, Yu Ting Huang, Chih Hung Yang, Chih Ying Yen, Kuei Jyun Chen, Yi Cih Wu, Jia Ming Lin
  • Applied Mechanics and Materials, September 2017, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/amm.870.401
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The following have contributed to this page: Prof. Shen-Li Chen