What is it about?
An algorithm for finding out 3D optical characteristics of thin (thickness <1000 nm) films if you have measured transmittance and/or reflectance of the linear polirized light. There is the ability to calculate the dielectric constant and thickness of measured thin film.
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This page is a summary of: Solving the inverse problem for determining the optical characteristics of materials, Discrete and Continuous Models and Applied Computational Science, December 2020, Peoples' Friendship University of Russia,
DOI: 10.22363/2658-4670-2020-28-4-378-397.
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