Characterizing molecular junctions through the mechanically controlled break-junction approach

Bingqian Xu, Joseph Hamill, Kun Wang
  • Reports in Electrochemistry, May 2014, Taylor & Francis
  • DOI: 10.2147/rie.s46629

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http://dx.doi.org/10.2147/rie.s46629

The following have contributed to this page: Mr Kun Wang