Corn ( L.) Yield Prediction Using Multispectral and Multidate Reflectance

Jiyul Chang, David E. Clay, Kevin Dalsted, Sharon Clay, Mary O'Neill
  • Agronomy Journal, January 2003, American Society of Agronomy
  • DOI: 10.2134/agronj2003.1447

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http://dx.doi.org/10.2134/agronj2003.1447

The following have contributed to this page: Dr Sharon Clay