What is it about?
The aim of this article is to present a method of estimating the life time probability distribution of new technical devices based on expert assessments of only a few parameters characterizing the expected life time of these objects.
Featured Image
Why is it important?
Our proposal concerns devices, for which it is not possible to obtain either direct – historical data, or indirect – data concerning the influence of the degradation of the examined device on the quality of the product.
Perspectives
Further work of the authors will aim to generalize the developed method also to other probability distributions and to integrate this method with Bayesian inference process in operational decision making.
Ph.D, D.Sc. Karol Andrzejczak
Politechnika Poznanska
Read the Original
This page is a summary of: A method for estimating the probability distribution of the lifetime for new technical equipment based on expert judgement, Eksploatacja i Niezawodnosc - Maintenance and Reliability, December 2021, Polskie Naukowo-Techniczne Towarzystwo Eksploatacyjne,
DOI: 10.17531/ein.2021.4.18.
You can read the full text:
Contributors
The following have contributed to this page







