Surface and Interface Characterization of Ion Beam Re-crystallized Si

P. K. Sahoo, B. Satpati, S. Dey, P. V. Satyam, T. Som, V. N. Kulkarni
  • MRS Proceedings, January 2002, Cambridge University Press
  • DOI: 10.1557/proc-750-y9.12

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http://dx.doi.org/10.1557/proc-750-y9.12

The following have contributed to this page: Biswarup Satpati