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This study investigate dynamic of hydrogen in a-Si:H thin film. Some hydrogen is bonded, but can not be observed using infrared spectroscopy. The calibrated temperature desorption spectroscopy was utilised to predict the hydrogen dynamic through its activation energy in the structure.
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This page is a summary of: A Study of Non-Infrared-Active Hydrogen Bonding in a-Si:H Thin Film using combined Calibrated Temperature Desorption Spectroscopy and FTIR, MRS Proceedings, January 2000, Cambridge University Press,
DOI: 10.1557/proc-609-a26.3.
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