Preparation and characterization of the defect–conductivity relationship of Ga-doped ZnO thin films deposited by nonreactive radio-frequency–magnetron sputtering

M. Lalanne, J.M. Soon, A. Barnabé, L. Presmanes, I. Pasquet, Ph. Tailhades
  • Journal of Materials Research, December 2010, Cambridge University Press
  • DOI: 10.1557/jmr.2010.0300

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http://dx.doi.org/10.1557/jmr.2010.0300

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