What is it about?
Fundamental equations for texture, stress and crystal size analysis derived with unit diffraction vector approach.
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Why is it important?
X-ray diffraction can characterize materials of all kinds, such as metals, polymers, ceramics, semiconductors, thin films, biomaterials and composites. The advance in two-dimensional X-ray detectors has further enhanced the applications of XRD. Two-dimensional diffraction pattern contains abundant information about the atomic arrangement, microstructure and defects of a solid or liquid material. This paper covers the basic concept and fundamental equations for typical applications, such as texture, stress, and crystal size.
Perspectives
I hope the unit diffraction vector approach can be further explored for other XRD applications with 2D diffraction pattern.
Bob He
Bruker Corporation
Read the Original
This page is a summary of: Algorithms of Two-Dimensional X-Ray Diffraction, MRS Advances, January 2016, Cambridge University Press,
DOI: 10.1557/adv.2016.409.
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