Dependence of structural and optoelectronic properties on thickness of γ-cui thin films deposited by vacuum thermal evaporation

Lawrence K. Dintle, Pearson V.C. Luhanga, Charles Moditswe, Cosmas M. Muiva
  • MRS Advances, March 2018, Cambridge University Press
  • DOI: 10.1557/adv.2018.317
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