Dependence of structural and optoelectronic properties on thickness of γ-cui thin films deposited by vacuum thermal evaporation

Lawrence K. Dintle, Pearson V.C. Luhanga, Charles Moditswe, Cosmas M. Muiva
  • MRS Advances, March 2018, Cambridge University Press
  • DOI: 10.1557/adv.2018.317

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1557/adv.2018.317

In partnership with: