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Why is it important?
It allows in estimating device parameters in a robust manner
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This page is a summary of: On Estimating Differential Conductance from Noisy I-V Measurements in Delineating Device Parameters, Acta Electrotechnica et Informatica, December 2017, Technical University of Kosice, Faculty of Electrical Engineering and Informatics,
DOI: 10.15546/aeei-2017-0027.
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