Trace Elemental Analysis Technologies using Atmospheric Plasma Sources

Kaori Shigeta, Yoichi Nagata, Takahiro Iwai, Hidekazu Miyahara, Akitoshi Okino
  • IEEJ Transactions on Fundamentals and Materials, January 2010, Institute of Electrical Engineers of Japan (IEE Japan)
  • DOI: 10.1541/ieejfms.130.955

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http://dx.doi.org/10.1541/ieejfms.130.955

The following have contributed to this page: Professor Akitoshi Okino