Problems in measuring diffuse X-ray scattering

  • T. Richard Welberry, Darren J. Goossens, Aidan P. Heerdegen, Peter L. Lee
  • Zeitschrift für Kristallographie - Crystalline Materials, January 2005, De Gruyter
  • DOI: 10.1524/zkri.2005.220.12.1052

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http://dx.doi.org/10.1524/zkri.2005.220.12.1052

The following have contributed to this page: Professor Thomas Richard Welberry and Dr Darren J Goossens