A Transmission Electron Microscopy Study of the Structure and Annealing Behavior of Copper-Krypton Deposits

  • John H. Evans, Robert Williamson, Derek S. Whitmell
  • November 1985, ASTM International
  • DOI: 10.1520/stp87019850041

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http://dx.doi.org/10.1520/stp87019850041

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