STR Data for the AmpFℓSTR Profiler Plus from Western China

  • B. W. Ying, Y. G. Wei, X. M. Sun, Y. P. Hou
  • Journal of Forensic Sciences, January 2005, ASTM International
  • DOI: 10.1520/jfs2004507

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http://dx.doi.org/10.1520/jfs2004507

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