Use of a Silicon Carbide Sampling Accessory for the Diffuse Reflectance Infrared Fourier Transform Analysis of Samples of Interest to Forensic Science

Williams D. Mazzella, Christopher J. Lennard
  • Journal of Forensic Sciences, March 1991, ASTM International
  • DOI: 10.1520/jfs13058j

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http://dx.doi.org/10.1520/jfs13058j

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