Graphical Tools for RFLP Measurement Quality Assurance: Single-Locus Charts

  • David L. Duewer, Hung-Kung Liu, Dennis J. Reeder
  • Journal of Forensic Sciences, September 1999, ASTM International
  • DOI: 10.1520/jfs12025j

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http://dx.doi.org/10.1520/jfs12025j

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