Examination of dielectric strength of thin Parylene C films under various conditions

Andreas Heid, Rene von Metzen, Alfred Stett, Volker Bucher
  • Current Directions in Biomedical Engineering, January 2016, De Gruyter
  • DOI: 10.1515/cdbme-2016-0012

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http://dx.doi.org/10.1515/cdbme-2016-0012

The following have contributed to this page: Dr. Alfred Stett, Andreas Heid, and Volker Bucher