Examination of dielectric strength of thin Parylene C films under various conditions

Andreas Heid, Rene von Metzen, Alfred Stett, Volker Bucher
  • Current Directions in Biomedical Engineering, January 2016, De Gruyter
  • DOI: 10.1515/cdbme-2016-0012
The author haven't finished explaining this publicationThe author haven't finished explaining this publication

The following have contributed to this page: Dr. Alfred Stett, Andreas Heid, and Volker Bucher