RFID technology innovations: the use of patent data

Yen Chun Jim Wu, Tzu Chin Yen
  • International Journal of Manufacturing Technology and Management, January 2007, Inderscience Publishers
  • DOI: 10.1504/ijmtm.2007.011404

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http://dx.doi.org/10.1504/ijmtm.2007.011404

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