Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection

  • Kent A. Meyer, Kin C. Ng, Zhanjun Gu, Zhengwei Pan, William B. Whitten, Robert W. Shaw
  • Applied Spectroscopy, January 2010, SAGE Publications
  • DOI: 10.1366/000370210790572070

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http://dx.doi.org/10.1366/000370210790572070

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