Conical refraction as a tool for polarization metrology

Alba Peinado, Alex Turpin, Angel Lizana, Estefania Fernández, Jordi Mompart, Juan Campos
  • Optics Letters, October 2013, Optical Society of America (OSA)
  • DOI: 10.1364/ol.38.004100
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The following have contributed to this page: Professor Juan Campos