Characterization of Soybean Yield Variability Using Crop Growth Models and 13C Discrimination

Joel O. Paz, William D. Batchelor, David E. Clay, Sharon A. Clay, Cheryl Reese
  • January 2003, American Society of Agricultural and Biological Engineers (ASABE)
  • DOI: 10.13031/2013.13849

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http://dx.doi.org/10.13031/2013.13849

The following have contributed to this page: Dr Sharon Clay