Noise Effect on Thin Film Characterization Using Rotating Polarizer Analyzer Ellipsometer

  • T.M. El-Agez, S.A. Taya
  • Acta Physica Polonica A, July 2012, Institute of Physics, Polish Academy of Sciences
  • DOI: 10.12693/aphyspola.122.15

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The following have contributed to this page: Prof. Sofyan A Taya