Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry

Daniel Lehmann, Falko Seidel, Dietrich RT Zahn
  • SpringerPlus, January 2014, Springer Science + Business Media
  • DOI: 10.1186/2193-1801-3-82

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http://dx.doi.org/10.1186/2193-1801-3-82

The following have contributed to this page: Professor Dietrich RT Zahn