Publication
The Diabetes Technology Society Error Grid and Trend Accuracy Matrix for Glucose Monitors
David C. Klonoff, Guido Freckmann, Stefan Pleus, Boris P. Kovatchev, David Kerr, Chui (Cindy) Tse, Chengdong Li, Michael S. D. Agus, Kathleen Dungan, Barbora Voglová Hagerf, Jan S. Krouwer, Wei-An (Andy) Lee, Shivani Misra, Sang Youl Rhee, Ashutosh Sabharwal, Jane Jeffrie Seley, Viral N. Shah, Nam K. Tran, Kayo Waki, Chris Worth, Tiffany Tian, Rachel E. Aaron, Keetan Rutledge, Cindy N. Ho, Alessandra T. Ayers, Amanda Adler, David T. Ahn, Halis Kaan Aktürk, Mohammed E. Al-Sofiani, Timothy S. Bailey, Matt Baker, Lia Bally, Raveendhara R. Bannuru, Elizabeth M. Bauer, Yong Mong Bee, Julia E. Blanchette, Eda Cengiz, James Geoffrey Chase, Kong Y. Chen, Daniel Cherñavvsky, Mark Clements, Gerard L. Cote, Ketan K. Dhatariya, Andjela Drincic, Niels Ejskjaer, Juan Espinoza, Chiara Fabris, G. Alexander Fleming, Monica A. L. Gabbay, Rodolfo J. Galindo, Ana María Gómez-Medina, Lutz Heinemann, Norbert Hermanns, Thanh Hoang, Sufyan Hussain, Peter G. Jacobs, Johan Jendle, Shashank R. Joshi, Suneil K. Koliwad, Rayhan A. Lal, Lawrence A. Leiter, Marcus Lind, Julia K. Mader, Alberto Maran, Umesh Masharani, Nestoras Mathioudakis, Michael McShane, Chhavi Mehta, Sun-Joon Moon, James H. Nichols, David N. O’Neal, Francisco J. Pasquel, Anne L. Peters, Andreas Pfützner, Rodica Pop-Busui, Pratistha Ranjitkar, Connie M. Rhee, David B. Sacks, Signe Schmidt, Simon M. Schwaighofer, Bin Sheng, Gregg D. Simonson, Koji Sode, Elias K. Spanakis, Nicole L. Spartano, Guillermo E. Umpierrez, Maryam Vareth, Hubert W. Vesper, Jing Wang, Eugene Wright, Alan H.B. Wu, Sewagegn Yeshiwas, Mihail Zilbermint, Michael A. Kohn
Journal of Diabetes Science and Technology, October 2024, SAGE Publications
DOI: 10.1177/19322968241275701