What is it about?
Usually the temperature of minute object is measured by an infrared thermograph. We have developed an image-temperature model based on the color image components for temperature estimations. The examined object is the cobra needle used in wafer testing.
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Why is it important?
The particle swarm optimization (PSO) algorithm is successful applied in the construction of the image-temperature model which provides valuable references for making out the electrothermal effect of the palladium alloy needle used in wafer testing.
Perspectives
The model constructed by the PSO algorithm provides a good performance to present the correlations between the color image data and temperatures Users can monitor the temperature of the minute needle based on the image data captured by a digital video camera to take the place of an infrared thermograph.
Professor Dar-Yuan Chang
Chinese Culture University
Read the Original
This page is a summary of: An image–temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm, Proceedings of the Institution of Mechanical Engineers Part C Journal of Mechanical Engineering Science, April 2016, SAGE Publications,
DOI: 10.1177/0954406216645131.
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