Characterization, modeling, and control of Ni-Ti shape memory alloy based on electrical resistance feedback

Brian Lynch, Xin-Xiang Jiang, Alex Ellery, Fred Nitzsche
  • Journal of Intelligent Material Systems and Structures, July 2016, SAGE Publishing
  • DOI: 10.1177/1045389x16633764
The author haven't finished explaining this publicationThe author haven't finished explaining this publication

The following have contributed to this page: Dr Brian Kennedy Lynch