Publication not explained

This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.

If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.

Featured Image

Read the Original

This page is a summary of: Investigation of the Dielectric Function of Solution-Processed InGaZnO Films Using Ellipsometry, Journal of Nanoscience and Nanotechnology, July 2012, American Scientific Publishers, DOI: 10.1166/jnn.2012.6324.
You can read the full text:

Read

Contributors

Be the first to contribute to this page