Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device

Tzu-Hsuan Lin, Yung-Chi Lu, Shih-Lin Hung
  • The Scientific World JOURNAL, January 2014, Hindawi Publishing Corporation
  • DOI: 10.1155/2014/729027

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http://dx.doi.org/10.1155/2014/729027

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