Surface-Enhanced Raman Scattering as an Emerging Characterization and Detection Technique

Mustafa Culha, Brian Cullum, Nickolay Lavrik, Charles K. Klutse
  • Journal of Nanotechnology, January 2012, Hindawi Publishing Corporation
  • DOI: 10.1155/2012/971380
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The following have contributed to this page: Professor Mustafa Culha