Ge/Si Quantum Dots Superlattices Grown at Different Temperatures and Characterized by Raman Spectroscopy and Capacitance Measurements

A. D. Rodrigues, A. J. Chiquito, G. Zanelatto, A. G. Milekhin, A. I. Nikiforov, V. V. Ulyanov, O. P. Pchelyakov, D. R. T. Zahn, J. C. Galzerani
  • Advances in Condensed Matter Physics, January 2012, Hindawi Publishing Corporation
  • DOI: 10.1155/2012/176053
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