Using Synchrotron X-Ray Nano-CT to Characterize SOFC Electrode Microstructures in Three-Dimensions at Operating Temperature

P. R. Shearing, R. S. Bradley, J. Gelb, S. N. Lee, A. Atkinson, P. J. Withers, N. P. Brandon
  • Electrochemical and Solid-State Letters, January 2011, The Electrochemical Society
  • DOI: 10.1149/1.3615824

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http://dx.doi.org/10.1149/1.3615824

The following have contributed to this page: Professor Philip J Withers