Application of Hasselman’s Crack Propagation Model to Insertion Electrodes

  • Yang-Tse Cheng, Mark W. Verbrugge
  • Electrochemical and Solid-State Letters, January 2010, The Electrochemical Society
  • DOI: 10.1149/1.3455179

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http://dx.doi.org/10.1149/1.3455179

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