Comparison between SOI nMOSFET's under Uniaxial and Biaxial Mechanical Stress in Analog Applications

Márcio S. Souza, Felipe N. Souza, Michelly De Souza, Marcelo A. Pavanello
  • January 2011, The Electrochemical Society
  • DOI: 10.1149/1.3615174

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http://dx.doi.org/10.1149/1.3615174

The following have contributed to this page: Prof. Marcelo A Pavanello