Influence of Fin Width and Channel Length on the Performance of Buffers Implemented with Standard and Strained Triple-Gate nFinFETs

Marcelo A. Pavanello, João A. Martino, Eddy Simoen, Rita Rooyackers, Nadine Collaert, Cor Claeys
  • January 2009, The Electrochemical Society
  • DOI: 10.1149/1.3183765

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Prof. Marcelo A Pavanello