Influence of Fin Width and Channel Length on the Performance of Buffers Implemented with Standard and Strained Triple-Gate nFinFETs

Marcelo A. Pavanello, João A. Martino, Eddy Simoen, Rita Rooyackers, Nadine Collaert, Cor Claeys
  • January 2009, The Electrochemical Society
  • DOI: 10.1149/1.3183765

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http://dx.doi.org/10.1149/1.3183765

The following have contributed to this page: Prof. Marcelo A Pavanello