Novel sizing algorithm for yield improvement under process variation in nanometer technology

  • Seung Hoon Choi, Bipul C. Paul, Kaushik Roy
  • January 2004, ACM (Association for Computing Machinery)
  • DOI: 10.1145/996566.996695

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1145/996566.996695

In partnership with:

Link to ACM (Association for Computing Machinery) showcase