What is it about?

Over the past few years, there has been a significant improvement in the domain of few-shot learning. This learning paradigm has shown promising results for the challenging problem of anomaly detection, where the general task is to deal with heavy class imbalance. This paper presents a new approach to few-shot classification, where we employ the knowledge base of multiple pre-trained convolutional models that act as the backbone for our proposed few-shot framework. Our framework uses a novel ensembling technique for boosting the accuracy while drastically decreasing the total parameter count, thus paving the way for real-time implementation.

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Why is it important?

This work introduces a new lightweight framework which reduces the computational cost while improving the previous state of the art results in the few shot learning domain.

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This page is a summary of: Convolutional Ensembling based Few-Shot Defect Detection Technique, December 2022, ACM (Association for Computing Machinery),
DOI: 10.1145/3571600.3571607.
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