Measurements of second-order optical susceptibility in crystalline and porous silicon

M. Falasconi, L. C. Andreani, M. Patrini, A. M. Malvezzi, V. Mulloni, L. Pavesi
  • November 2001, World Scientific Pub Co Pte Lt
  • DOI: 10.1142/9789812810854_0005

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http://dx.doi.org/10.1142/9789812810854_0005

The following have contributed to this page: Viviana Mulloni