Investigation of meta- and in-stability effects in hydrogenated microcrystalline silicon thin films by the steady-state measurement methods 1

  • Mehmet Günes, Hamza Cansever, Gökhan Yilmaz, Muzaffer H. Sagban, Vladimir Smirnov, Friedhelm Finger, Rudolf Brüggemann
  • Canadian Journal of Physics, July 2014, Canadian Science Publishing
  • DOI: 10.1139/cjp-2013-0630

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http://dx.doi.org/10.1139/cjp-2013-0630