Influence of hydrogen concentration on void-related microstructure in low hydrogen amorphous and crystalline silicon materials 1

W. Beyer, U. Breuer, R. Carius, W. Hilgers, D. Lennartz, F.C. Maier, N.H. Nickel, F. Pennartz, P. Prunici, U. Zastrow
  • Canadian Journal of Physics, July 2014, Canadian Science Publishing
  • DOI: 10.1139/cjp-2013-0555

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http://dx.doi.org/10.1139/cjp-2013-0555