Determination of deep trapping states of the hole blocking layer in multilayer amorphous selenium X-ray detectors using transient dark current analysis 1

  • M.Z. Kabir, Safayat-Al Imam
  • Canadian Journal of Physics, July 2014, Canadian Science Publishing
  • DOI: 10.1139/cjp-2013-0536

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1139/cjp-2013-0536