Examination of CoNiCu thin films by using XRF and XRD

Ö. Söğüt, Ç. Dönük, G. Apaydın, Ö.F. Bakkaloğlu
  • Canadian Journal of Physics, May 2014, Canadian Science Publishing
  • DOI: 10.1139/cjp-2012-0538

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http://dx.doi.org/10.1139/cjp-2012-0538