Nanostructre based antireflection coatings for EO/IR sensor applications

  • Ashok K. Sood, Roger E. Welser, Adam W. Sood, E. James Egerton, Yash R. Puri, David Poxson, Sammer Chhajed Jaehee Cho, E. Fred Schubert, Dennis L. Polla, Nibir K. Dhar, Raymond S. Balcerak, Martin B. Soprano
  • February 2011, SPIE
  • DOI: 10.1117/12.882535

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http://dx.doi.org/10.1117/12.882535

The following have contributed to this page: Professor Jaehee Cho