Nanostructure-based antireflection coatings for EO/IR sensor applications

  • Ashok K. Sood, Roger E. Welser, Yash R. Puri, David J. Poxson, Martin F. Schubert, Jaehee Cho, E. Fred Schubert, Dennis L. Polla, Martin B. Soprano
  • April 2010, SPIE
  • DOI: 10.1117/12.852706

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http://dx.doi.org/10.1117/12.852706

The following have contributed to this page: Professor Jaehee Cho